Semiconductor FPD Inspection & Flat Panel Display Inspection Microscopes

● Head: 0-35° Tilting trinocular, Erect image, interpupillary distance: 50-76mm, splitting ratio: 100:0 or 0:100
● Eyepieces: PL10X/25mm, Diopter adjustable
● Objective: B&D semi-aprochromatic metallurgical objective
                    5X/0.15, WD=13.5mm, 10X/0.3, WD=9.00mm
                    LWD B&D semi-aprochromatic metallurgical objective
                    20X/0.4, WD=8.50mm, 50X/0.55, WD=7.5mm
● Condensor: B&D reflect illumination, with Iris field diaphragm and aperture diaphragm, central adjustable, with filter slot and polarizing slot, with switch device sIth bright and dark field
● Nosepiece: Electronic BD sextuple nosepiece with DIC slot
● Focus: Coaxial Coarse and fine focusing adjustment, Coarse adjustment distance: 35mm, precision of fine adjustment: 0.001mm, with loosen and tight limit ring
● Stage: 14X12 inches three-layer mechanical stage with low position coaxial adjustment, size: 718mm X 420mm, moving range: 356mm X 305mm; with clutch handle for quick movement; glass plate for reflected use
● Illumination: 12V 100W Halogen lamp(for reflection/
Transmitted), 12V 100W Halogen lamp (PHILIPS 7724)
● IF Filter: Natural IF Filter (for reflection)
● Polarizing kits: Polarizer (for reflection), Fixed analyzer (for reflection)